Robert Smythe, Apre Instruments , United States , Interferometric Measurement of Mid-Spatial Frequency Wavefront Errors Invited.Sven Schröder, Fraunhofer IOF , Germany , Surface Characterization of High-End Optical Components using Light Scattering Invited.John Schaefer, Raytheon EO Innovations , United States , Advances in Diamond Turning Invited.Jyrki Saarinen, University of Eastern Finland , Finland , Additive Manufacturing for Small and Medium Sized Optics Invited.Joseph Owen, Univ of North Carolina at Charlotte , Diamond Milling of IR Materials Invited.Mahito Negishi, Canon Inc , Japan , New Stitching Algorithm using an Approximated Reference Shape Invited.Brigid Mullany, Univ of North Carolina at Charlotte , United States , Fiber Based Polishing Tools for Optical Applications Invited.Cormic Merle, United States , Metrology for the LSST M2: Large Holographic Stitching Technique Invited.
Manyalibo Matthews, Lawrence Livermore National Laboratory , United States , IR Laser Processing Techniques for NIF Optics Invited.Mohammadreza Khorasaninejad, Harvard University , United States , Optics with Metasurfaces: Beyond Refractive and Diffractive Optics Invited.James Fienup, University of Rochester , United States , Phase Retrieval for Optical Metrology: Past, Present and Future Invited.Oliver Faehnle, FISBA AG , Switzerland , Machine Acceleration Effects on Computer Controlled Polishing Invited.Turan Erdogan, Plymouth Grating Laboratory, Inc. , United States , Manufacturing Large-format Spherical and Cylindrical Laser Focusing Gratings using Scanning-beam Interference Lithography Invited.Glen Cole, Thirty Meter Telescope , United States , Optical Fabrication and Metrology for the Thirty Meter Telescope Primary Mirror Segments Invited.Andreas Beutler, Mahr GmbH , Germany , Referencing and Form Measurements of Freeform Optics Invited.
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